Analog and Mixed Signal Test Method based on OBIST Technique
نویسندگان
چکیده
منابع مشابه
Oscillation-Based Test Technique for Analog Cores in Mixed-Signal Integrated Circuits Using the Field Programmable Analog Array Technology
Modern System-on-Chip (SoC) designs are increasingly mixed-signal Very Large Scale Integrated (VLSI) designs that require efficient design and testing methodologies to manage the design complexity and the time-to-market constraints. Also, in mixed-signal integrated circuits (ICs), testing analog cores is the most difficult task and it’s one of the major cost factors in the overall IC manufactur...
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ژورنال
عنوان ژورنال: International Journal of Computer Applications
سال: 2015
ISSN: 0975-8887
DOI: 10.5120/19187-0684